Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
نویسندگان
چکیده
Author: Shieh YR; Wu CW (REPRINT) Corporate Source: NATL TSING HUA UNIV,DEPT ELECT ENGN/HSINCHU//TAIWAN/ (REPRINT); NATL TSING HUA UNIV,DEPT ELECT ENGN/HSINCHU//TAIWAN/ Journal: IEEE DESIGN & TEST OF COMPUTERS , 1998 , V 15 , N2 ( APR-JUN ) , P 56-64 ISSN: 0740-7475 Publication date: 19980400 Publisher: IEEE COMPUTER SOC , 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1314 Language: English Document Type: HARDWARE REVIEW Geographic Location: TAIWAN Subfile: CC ENGI--Current
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عنوان ژورنال:
- J. Electronic Testing
دوره 9 شماره
صفحات -
تاریخ انتشار 1996